This data set consists of backside scanning electron microscope (SEM) images of four different CMOS integrated circuits (90nm, 65nm, 40nm and 28nm technologies) recorded for this study. The images are tiled with a 10% overlap and arranged in a grid according to their respective file names (Tile_001-YYY-XXX-[...].tif). More precise coordinates generated by stitching can be found in the file "stitching.zip" which is included in the data set, as well as in the corresponding GitHub repository.
Additionally, the data set contains the GDSII design files of all imaged chips, although only an abstracted version. The abstracted design files contain only the standard cell area and furthermore only the bounding boxes of the cells with anonymized identifiers. Some of the identifiers contain the keyword "FILL_" denoting a filler cell. Identifiers not containing the keyword refer to functional standard cells. Identical identifiers also denote identical cell types. As detailed in our study, each of the GDSII files is trojanized in the sense that it contains 10 manipulations where cells have been exchanged by different cells of the same size (4 filler cell replacements and 6 standard cell replacements). The positions of the modifications on each chip are neither revealed in our study nor in this data set. Yet, verification of your own detection results should be possible to some extent with the image cutouts provided in the appendix of the study. Should the exact positions be needed for related research, or should the benign, untrojanized files be required, do not hesitate to contact the authors.
Software and details how to use the dataset can be found in the respective GitHub repository at the following URL: https://github.com/emsec/ChipSuite
Please make sure to always cite our study when using any part of our data set or code for your own research publications!
@inproceedings {2023puschner,
author = {Endres Puschner and Thorben Moos and Steffen Becker and Christian Kison and Amir Moradi and Christof Paar},
booktitle = {2023 IEEE Symposium on Security and Privacy (SP)},
title = {Red Team vs. Blue Team: A Real-World Hardware Trojan Detection Case Study Across Four Modern CMOS Technology Generations},
year = {2023},
pages = {763-781},
keywords = {hardware-trojans;very-large-scale-integration;gdsii;integrated-circuits-verification},
doi = {10.1109/SP46215.2023.00044},
url = {https://doi.ieeecomputersociety.org/10.1109/SP46215.2023.00044},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
month = {may}
}
